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Electron energy loss spectroscopy (EELS) is a form of electron microscopy in which a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering , which means that they lose energy and have their paths slightly and randomly deflected.
EELS is a technique that uses high energy electrons to analyze the content and create images of thin samples. Learn how EELS works, what data it provides, and its limitations with regard to sample thickness and resolution.
The EELS Data Base is a compilation of valence and core-loss spectra from Electron Energy Loss Spectroscopy experiments and X-Ray spectra. With 290 spectra covering 43 elements of the periodic table, it is the largest open access EELS database.
Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials. Offers extended coverage of radiation damage and delocalization as limits to spatial resolution.
Electron energy loss spectroscopy (EELS) is a characterization technique to measure kinetic energy change of electrons after inelastic interactions with materials, which provides structural and chemical information of the materials studied.
1 de ene. de 2011 · 14 Citations. Abstract. Electron energy-loss spectroscopy (EELS) involves analyzing the energy distribution of initially monoenergetic electrons after they have interacted with a specimen. This interaction is sometimes confined to a few atomic layers, as when a beam of low-energy (100–1000 eV) electrons is “reflected” from a solid surface.
1 de may. de 2005 · Because the TEM requires a thin specimen (to limit the amount of electron scattering), the amount of material analyzed by the beam can be very small (well below 10 −19 g). The imaging and diffraction capabilities of the TEM can be used to complement EELS analysis, with simultaneous X-ray energy-dispersive spectroscopy (XEDS) if ...
